Tender For Supply Of Fe Sem in India

Work Detail

Tender For Supply Of Fe Sem; The Fe-Sem With Se, Bse, Eds And Stem Accessories; 01 Electron Source Thermal Schottky Field-Emitter. Source Lifetime Should Be Guaranteed For 12 Months Or Longer 02 Beam Deceleration / Retardation / Booster Should Be Available 03 Operation Modes Se Imaging, Bse Imaging, Se / Bse Mix, Stem, Edx 04 Resolution 4.1. 1Nm Or Better Across All Voltages From 500V30kv. Ps: The Claim For Any Resolution Should Be Without Any Stage Bias & Independent Of Any External Parameters. ( Vendor Should Mention The Highest Resolution Achievable Without Deceleration ) All Resolution Claims For This Tender Will Be Evaluated Based On Edge Method ( All Bidders Need To Quote Resolution Only In Edge Method At Low / High Pressure And At Lower Kvs ( Including Current At 1Kvs ) Clearly Specified And Resolution Achieved At Above Specified Conditions. In Addition, The Resolution Should Be Average Value ( Not The Best Value ) And Step Contrast Should Also Be Clearly Mentioned ( Like 80:20, 70:30 Or 50:50 ) At Each Voltage Current Needs To Be Clearly Specified ( Mandatory ) For Any Claim Of Resolution. Evidence For Resolution Claims To Be Provided With Original Oem Brochure Along With Official Letter Stating The Claim For Resolution Should Be Independently Submitted Report From Previous Installation And Endorsement Regarding Resolution Claim And The User Experience / Running Of The Instrument Should Be Provided In Addition To Standard Oem Lab Reports Resolution Claim Needs To Be Proved On Site Of Installation For Any Claim With Standard Sample Independently ** If Vendors Fail To Do So Contract Will Be Unilaterally Terminated And Instrument Needs To Be Cleared From Site Of Installation At The Cost Of Vendor. 1 3 Need Written Letter For The Same In The Tender Document 4.2.1. Required Resolutions Are As Follows For The High Vacuum Condition 0.7 Nm @ 30 Kv Or Better ( Stem ) 0.7 Nm @ 15 Kv Or Better 1.1 Nm @ 1 Kv Or Better 1.1 Nm @ 500 V Or Better 4.2.2. Required Resolutions Are As Follows For The Low Vacuum / Variable Pressure Mode / Condition 1.2 Nm @ 15 Kv Or Better 1.8 Nm @ 3 Kv Or Better. 05 Operation Mode 5.1. High And Low Vacuum With The Variable Pressure Mode 5.2. The System Should Be Able To Operate To Visualize The Polymeric / Biological Samples In Their Original Form Without Using Any External Agents. 5.3. System Should Be Capable Of Doing Short Working Distance Analysis Both In Se And Bse In Variable Pressure Mode For High Resolution. 06 Electron Gun 6.1. High Brightness Field Emission Electron Gun ( Schottky Type ) With High Stability In Beam Current. 6.2. Auto Beam And Aperture Alignment, Auto Focus, Contrast, Brightness, Adjustable Stigmator, Variable Scan Speed, Scan Rotation, Tilt Correction And Em Shielding Of Column. 6.3. Full Computer Control Of Electron Optical Column And Microscope Functions. 6.4. Magnetic And Electrostatic / Super Hybrid Lens / Compound Lens Assembly For High Resolution Imaging With Shorter Working Distance. 6.5.Sem Chamber And Electron Gun Should Have Fully Integrated Self-Levelling Pneumatic Vibration Isolation. 07 Magnification 50X To 20, 00, 000X Or Better 08 Acceleration Voltage And Electron Column 8.1. Lower Limit: 20 V Or Less 8.2. Higher Limit: 30 Kv Or More 8.3. Variable In 10 Volts Steps ( Minimum ) 8.4. Overview Mode For Easy Sample Navigation Available At Voltage Range From 20 V To 30 Kv. 8.5. Autofocus – Automatic Fine Focus Control. 8.6. Auto-Wobble – Automatic Assistance In Aperture Alignment, With Adjustable Amplitude And Speed. 8.7. Optimized Beam Convergence Angle Per Aperture. 09 Chamber 9.1. A Large Chamber With All The Accessories Ports Should Be Accommodated In Addition At Least Additional 5-10 Free Accessory Port Should Be Provided. 9.2. Load Lock System For Easy And Quick Specimen Exchange Preferably In Less Than 5 Minutes 9.3. Minimum Specimen Size Through The Load Lock 14 Should Be 100Mm Diameter Or Better 9.4. Integrated Plasma Cleaner 9.5. Infrared Chamber Scope For A Real -Time View. Infrared Ccd Camera For Viewing Inside The Specimen Chamber 10 Stage 10.1.The Sample Stage Must Be 5 -Axis Eucentric Motorized Stage Which Can Be Controlled By Both Software And Manually By Joystick. 10.2. Required Stage Movements Are Mentioned Below: 10.2.1. X=100Mm Or More 10.2.2. Y=100Mm Or More 10.2.3. Z= 20 Mm Or More 10.2.4. Tilt = -5° To +70°Or More 10.2.5. R=0 -360° - Continuos. 10.3. The System Should Accommodate Samples With Size At Least 150 Mm Diameter Through Standard Specimen Exchange. 10.4.Computerized Stage Position And Retrieval. 10.5. Measurement On A Grid With Desired Number Of Points And At Several Locations With Image Stitching 10.6. Dual Joystick For Stage Motor Control In All Axis Direction 10.7. Store And Recall Of Sample Positions Functions To Select Features, Center And Zoom Selected Feature, Multidirectional Stage Drive, Rotation Etc., Should Be Possible Through The Software. 11 Electron Optics 11.1. Should Have Lens Design With Combination Of Both Magnetic & Electrostatic Lenses To Achieve High Resolution Sub Nm Imaging Of Magnetic Materials Even At Shorter Working Distances Without Any Drift / Aberrations. 11.2. The Offered Lenses Must Be Water Cooled In Nature. 11.3. The System Must Have Motorized Aperture. 12 Probe Current System Should Have Probe Current Of 10 Pa To 100Na Or Higher 13 Detectors 13.1. In Lens Secondary Electron Detector ( Et - Sed ) ( Everhart -Thornley ) 13.2. In -Lens / In -Column Secondary Electron Detector 13.3. In -Lens / In -Column Solid State Backscattered Electron Detector With Electron Energy Selection Capability For High Resolution Imaging At Lower Accelerating Voltages <0.5Kv 13.4. Simultaneous Acquisition Of Se Signals Should Be Possible. 13.5. Se And Bse Detection In Variable Pressure Mode 13.6. Eds Detector 13.7. In Chamber Ir Camera Fully Compatible With Imaging 13.8. Pneumatically Retractable Or Motorized Stem Detector For Bf, Df, Adf, Haadf Etc. Imaging. 13.9. Appropriate Energy Filters For Selection Of Se, Bse Signals And Combination Of Both Se And Bse 13.10. Should Have Navigation Camera 14 Scan Modes Raster Scan With Different Scan Speeds, Spot Mode, Line Scan Mode, Depth Of Field Mode, Line Scan Profile, Scan Rotation Mode 15 Split Screen And Live Multiple Signal Display ( At Least Four ) 15 Scanning & Display High -Definition Display System ( With 24 Inch Or More ) With 20 Megapixel Or Better With A Led Screen For High Quality Image In Real Time Under Graphical User Interface. Following Specific Criteria Should Be Maintained 15.1. Imaging And Processing Should Be Optimized For The Field Emission Scanning Electron Microscopy. 15.2. Capable Of Dynamic Focusing 15.3. Image Frame Size: Selectable Up To Pixel Density Of 6Kx4k Or Better. 15.4. It Should Have Auto -Brightness, Auto Contrast, Autofocus And Auto Stigmator. 15.5. Frame Averaging Up To At Least 250 Frames. 15.6.Line Averaging Up To At Least 250 Lines. 15.7. Combination Of Pixel And Frame Averaging. 15.8. Combination Of Pixel And Line Averaging. 15.9. Image: Post –Processing Options. 15.10. Macro -Editor With Access Of 250 Or More Instrument Control Functions. 15.11. An Interface For Python Scripting To Be Provided In Order To Allow Setting Up Of Customized Workflows. 15.12. Image Storage 15.13. Front -Panel Usb Ports, Cd / Dvd Recorder / Writer. 15.14. Storage Of Sem Images On Hard Disk In Standard Tiff, Bmp, Jpeg Formats In 8 Bit Or 16 - Bit Depth . 15.15. Operating Conditions Need To Be Stored ( And Retrieved Whenever In Need ) . File Management Is Through The Standard Microsoft Windows Operating System. 16 Image Processing 16.1. Software To Include Standard Functions Like Line And Frame Averaging, Scan Integration 16.2. Measurement Of Distance, Angle, Diameter, Pseudo Color Display, Split Screen Imaging Mode, Pip, Camera And Scan Mode Simultaneously, Frame Store With Variable Image Resolution From Low To High Value 16.3.Compatibility With Software’S Like Eds In Terms Of Area Selection, Spectrum Acquisition And Other Functions 16.4. All Image Analysis Functions And Any Additional Software’S For Sem, Eds And Stem To Analyze Images Like Histogram Size Distribution Etc. Must Be Provided Free Of Cost 17 Vacuum System 17.1. Fully Computer Controlled Vacuum System Complete With Air Cooled Tmp, Oil Free Suitable Rotary Pumps, Pneumatic Valves, Ion Getter Pump, Dry Nitrogen Venting Provision, Vacuum Readout And Display ( Clarify If Any In -Built Proper Safety Measures Against The Failure Of Power Supply, Vacuum, Water -Flow, Etc. Are Provided ) 17.2. Ultimate Vacuum Achievable In The Chamber Should Be Better Than 10 -6 Mbar. 17.3. System Should Be Fully Automatic With Interlocking Safeguards Provided Against Power Failure And Any Sudden Shutdown. Low To High Vacuum In The Chamber ( Sem Imaging Should Be Possible At Higher Pascal Or Better ) . The 16 System Should Have The Capability To Working Up To 500 Pa. All Should Be Oil Free And Diffusion Pump Free. 18 Software 18.1. Original Licensed Software For Smooth Operation Of The Microscope & Its Accessories, Stage Control, Vac 18.2. Vacuum Interlocks And Capable To Capture Se, Bse Etc. Images. 18.3. Image Analysis Software Like Histogram Size Distribution Must Be Included 18.4. 10 Usb Dongles Each Free Of Cost For Software / Image And Data Analysis. Additional Dongle For System Installation Software Etc 18.5. Fully Automated Operation Through Latest Update System Software Providing Various Image Processing And Measurement Features Like: Auto Beam Alignment, Beam Adjustment, Auto Filament Saturation. Auto Focus, Auto Stigmator, Auto Brightness And Contrast, Auto Start Etc. Control Panel For Adjustment Of Various Sem Functions Like Focus, Magnifications Etc. 18.6. Interface Between Sem And Eds. 18.7. The Sem Software Must Have Interface And Functionalities For Sem Operation, Stage Movement, Data Acquisition, Image Capture And Image Processing 18.8. Software Shall Have Features Like Measurement Functions, Adjustable Raster Scanning, Dynamic Focus, Tilt Correction Scan Rotation, Signal Inversion, Signal Mixing, Split Screen, Stage Co -Ordinate Storage And Recall, Stage Registration Etc. 19 Navigation Camera 19.1. It Should Be Color, High Resolution Integrated With User Interface For Convenient Navigation Over The Sample Options For Annotation And Saving Of The Image. 20 In -Situ Plasma Cleaning 20.1. In -Situ Sample And Chamber Cleaning By A Plasma Cleaner Or Similar Technique Should Be Available That Is Suitable To Remove Carbon And Other Contaminations From The Surface 21 Workstation 21.1. Should Have Microsoft Windows -Based Operating System, Network Ready. The Operating System, Drivers And Computer Hardware Should Be Supported For At Least 10 Years From The Date Of Purchase. Any Required Upgrades During This Time Should Be Provided Free Of Cost. 21.2. The Workstation Should Include Multiple Monitors With High Resolution, Standard Keyboard And Optical Mouse. 21.3. Latest Compatible Branded High -Speed Computer With Preloaded ( Factory Loaded ) Licensed Software For Fe -Sem Operating Parameters. 21.4. Specify Computer Speed, Processor, Ram And Graphics Card. 21.5. Computer Specs Should Be Better Than 64 -Bit Processor, Min 32 Gb Ram, 512 Gb Ssd + Min 2Tb Hard Disk, Usb Ports Minimum 8 That Are Free To Use, On Board Graphics And Any Other Necessary Ports For Connecting All Accessories 21.6. All The Computers For Fesem, Eds Must Be Imported / Factory Fitted And Tested With Pre -Loaded Software’S For Operating These Systems. 21.7. All The Computers / Workstations Should Be 17 Based On Latest Windows Os. 21.8. Vendor Should Also Provide A Spare Similar As Above Copy Of The Operating System And Back Up Of All The Fe -Sem Application And System Control Software On A Similar Configuration Standby Computer 22 Eds 22.1. The Eds System Should Be Very Latest, State - Of-Art System Which Should Seamlessly Get Integrated With The Proposed Fesem System 22.2. Ln2 Free Motorized Retractable Sdd X -Ray Detector ( With Protective Window ) Of At Least 65 Mm2 Area Or More With Energy Resolution Of Better Than 125 Ev At Mn K Alpha Line. Provision For High Sensitivity Light Element Analysis, To Offer Very High -Count Rate For Elemental Analysis And Mapping Applications. 22.3. The Detector Window Should Be Made Of By Robust Material Like Silicon Nitride ( Which Can Be Able To Prevent Puncture Of The Window ) With Honeycomb Grid Structure Supporting Grid, To Increase X Ray Transmissivity, The Detector Should Be Optimized For Low Energy X - Ray Transmission For Light Element Analysis Apart From Heavy Elements. 22.4. Detection Range Of Detector Should Be From Be To U. The Detector Should Be Able To Detect Al L Alpha Line. 22.5. The Eds Should Be Able To Do Quantitative, Qualitative Analysis, Phase Map, Drift Correction Moreover Software That Enables The Matching Of A Collected “Unknown” Spectrum To A Library Of Reference Spectra, Software Module Should Eliminate Elemental Contribution From Peak Overlap. 22.6. Standard Sample Set For Eds Calibration. 22.7. Eds Detectors Should Be Motorized While Moving Into Specimen Chamber And Retracting Out Of The Specimen Chamber. It Should Be Software Controlled. 22.8. The Eds Detector Must Be Low Vacuum / Variable Pressure Compatible 22.9. Necessary Software Should Be Provided For Qualitative, Fully Quantitative ( With Standards ) , And Standard Less Quantitative Elemental Analysis. 22.10. Preferably A Standard Data Set For Quantitative Analysis At Low Energy ( <5Kv ) May Also Be Included. 22.11. Image Acquisition And Processing Software Should Be Provided For The X -Ray Images. Image Mixing And Overlapping Of Multiple Elemental Scans With False Color Should Be Possible, Along With The Sem Image. Multiple Line Scan Displays And Comparison. 22.12. Software For Peak Fitting, Peak Count, Pulse Pile -Up Rejection, Background Subtraction And Quantitative Analysis Should Be Provided. 22.13. Provision For Area Scan, Line Scan ( For Simultaneous Acquisition From At Least 8 Element Windows. Single Point And Multipoint Acquisition With A Grid On The Sample. Magnification Should Be Same As That On Sem. 22.14. Possibility To Reduce Raster Without Changing The Mag On Microscope. 18 22.15. Software Provision For Comparison Of Two Or More Spectra And Display Of More Than One Spectrum In Single Screen Should Be There. 22.16. The Eds System Should Be Completely Compatible With The Quoted Sem System 22.17. A Separate Computer And Monitor To Be Provided For Eds Analysis. Also, The Possibility To Simultaneously Display Image ( With 1:1 Correspondence With The Sem Image ) Showing The Point Of Interest And The Spectra Should Be There. 22.18. Vendor Should Provide Full Interfacing Of The Eds System With The Sem Including The Necessary Hardware And Software. 23 Stem Stem Detection Unit: For An Observation Of Bright Field Stem Image ( Bf -Stem ) And Dark Field Stem ( Df -Stem ) . Detector ：Scintillator / Photomultiplier Method Specimen: Thin Film Specimen Mounted On The Grid Mesh Which Diameter Is 3 Mm Signal Mode: Bf -Stem / Df -Stem Observe The Df -Stem Image With In Chamber Se Detector Using An Attached Stem Holder, For Both The Vacuum Mode: High Vacuum Mode And Vp Mode. Bright Field Stem Detector Df Stem Selectable Type Stem Aperture Diameter. 24 Calibration Standards 24.1. Standard Test Samples To Be Provided By The Vendor To Demonstrate The Ultimate Resolution On Fesem. 24.2. Magnification Calibration Standard To Be Provided By The Vendor For Fesem. 24.3. Calibration Standard Samples For Stoichiometry Standardizations Should Be Provided With The System; Including Pure Metals ( Au ) , Oxides, Nitrides, Alloys Etc. 24.4. All The Samples Should Be Mounted On Stubs For Ease Of Use. The Standard Sample Provided Should Clearly Distinguish The Peaks Between Oxygen And Nitrogen For Eds System. 24.5.Calibration Certificate Shall Be Provided With All The Above Standard Samples. 25 Accessories ( All Accessories To Be Quoted Separately ) 25.1. Chiller For Lens Cooling ( Daichi Or Equivalent ) 25.2. Imported Compressor ( Compact Noise Free ) Oil Free With Moisture Trap Including Pipes And Connectors Any Other Accessories Required For System Operation 25.3. Table For Operation Console Etc Should Be Provided 25.4. Independent And Separate Gold Sputter Coater, Carbon Evaporation Unit And Platinum Coater With Touchscreen Interface & Suitable Oil Free Vacuum Pump - Au Target - 2 No., Platinum Target -2 Targets Must Be Min 4 -Inch Dia And Min 2Mm Thick & Carbon Rods – 10 Nos 25.5. Provision To Mount 4 -Inch Circular Or Square Single Or Multiple Samples Should Be Provided 25.6. Silver Paste ( 4 Bottles 100Ml Each ) 25.7. 10 Nos. Of Double -Sided Conductive Carbon And Coper Tape Rolls Each Of At Least 50 Meters In Length. 19 25.8. Specimen Stub: 100 Nos. 25.9. Standard Sample Holders For 1, 2, 3, 4 -Inch Circular And Square Wafers / Substrates, Multi Specimen Holder, Pin / Cylindrical Stubs Etc. Carousel For Mounting Of At Least Six Specimens 25.10. Multipurpose Specimen Holder: 1 No. 25.11. Cross -Section Specimen Holder For Holding Variable Sample Thickness From 100 Micro Meter To 2 Mm And Additional Cross -Sectional Holders For Samples Up To Thickness Of 5Mm And For Variable Angles -2 No 25.12. Stubs For Carousel ( 24 Spare Stubs ) With Box To Keep Them 25.13. 45 -Degree Sample Holder - 1 25.14. Multiple Sample Holder: 2 Nos. 25.15. Specimen Holder For Stem: 1 No. 25.16. Tem Grids Carbon Coated -100 25.17. Standard Sample Set For Calibration Of Magnification And Resolution – 2 Set ( Preferably Tin Balls Or Metallic Composite Based ) 25.18. Complete Aperture ‐ Set: 1 No. 25.19. Extra Feg Emitter: 6 Nos. ( Whenever Required Need To Bring And Replace -Need To Store With Vendor ) . The Additional 6 Nos. Of Feg Source Should Be Provided Absolutely New. Refurbished Feg ( Feg Re -Tip ) Source Will Not Be Accepted. 25.20. On -Line Ups: 20 Kva With 2 Hr. Battery Back -Up. 25.21. Sample Navigation Or Camera Navigation For Multiple Samples Should Be Provided 25.22. Vendor Should Also Provide Specimen Handling Tools And Stage Tools. 25.23. Vendor Should Provide Two Sets Of Complete Aperture Set And One Set Of Spare Assorted All Metal Seals And Assorted Fuses Should Be Provided. 25.24. Critical Point Drying ( Cpd ) Unit With Necessary Add -Ons And Accessories Required For Its Use. 25.25. Dehumidifier Or Appropriate Humidity Controller Portable - 2 25.26. 2 - Tweezers For Holding Stubs And Sample Mounting 25.27. Additional 2 Tb Hard Disks May Be Asked For Data Backup 25.28. Essential Tool Kit Must Be Provided. 25.29. Nitrogen Gas Cylinders With Regulators As Required For The Operations Of The Equipment Be Provided. 26 Future Upgradation The Complete System Should Be Flexible Enough To Be Upgraded With Various Accessories At Any Point Of Time In Future. 27 Warranty Oem Default Warranty ( One ( 01 ) Year ) From The Date Of Successful Installation And Commissioning. Four Years’ Additional Comprehensive Warranty To Be Quoted. The Prices Of The Equipment ( Including Indigenous Items ) And Comprehensive Warranty Of Four Years All Together Shall Be Taken Into Account In Determining L1. Bidder Shall Note This Requirement While Quoting Their Rate 28 Pre -Installation Requirements Pr E -Installation Requirements Such As Room Size, Tolerable Limits Of Em Field And Vibration ( Mechanical ) , Required Power Rating, Utility 2 0 Requirements Are To Be Stated Clearly, And To Be Verified / Surveyed By The Supplier At The Installation Site. 29 Operation & Maintenance Manual Soft / Hard Copy Of The Operation & Maintenance Manual Should Be Provided In English Language For The Main Instrument, Eds, Ebsd And All Other Accessories. 30 Installation, Commissioning & Training 30.1. The Entire System Must Be Installed And Commissioned By The Supplier’S Trained & Experienced Engineer. 30.2. On-Site Operational & Basic Maintenance Training Of The Entire System Must Be Provided By The Supplier’S Engineer / Application Specialist For At Least 14 Working Days. 30.3. Vendor Should Have Demo Lab With Similar Instrument Or Equivalent To Run Iiser Berhampur Samples During The Instrument Failure Free Of Cost During Warranty Period. 30.4. It Will Be The Responsibility Of The Supplier For: Complete Installation Of Fesem With All Utilities And Accessories. Demonstration Of Full Specifications Using Standards ( To Be Provided By The Vendors ) For All The Parameters In Respect Of Fe-Sem, Eds And Stem. Minimum 14 Working Days On-Site Training On System Operation And Imaging After The Installation Is Over. 31 Low And High Temperature Stage Sem Should Be Quoted Temperature Range -185 Degree C To 200 Degree C. The Stage Should Be Complete With Mounting Frame, Vibration Isolation, Cold Shield, Feed Throughs For The Electrical Cables, Nitrogen Reservoir, And Temperature Controller For Controlling The Temperature With An Accuracy Of 1 K. Sample Size– Variable From 10Mm2 To 30 Mm2 Or More Consumables And Maintenance Kit For Two Years’ Operation. Installation And Demonstration Of System Performance 32 Additional Terms And Conditions 32.1. Suitable Dehumidifiers Should Be Quoted Along With The System-2 32.2. Include Sufficient Quantities Of Lens Grade Tissue Paper, Immersion Oil And Other Useful Accessories 32.3. Include A Detailed Colour Brochure Highlighting All The Features Of The Above Microscopes. 32.4. Free Installation And Training Workshop 32.5. Service Downtime: 48 Hrs. 32.6. Reinstallation / Relocation Of The Instrument To The Main Campus: System Should Be Reinstalled From The Present Transit Campus To The Permanent Campus Of Iiser-Bpr At Laudigaon Berhampur, Odisha, India With No Additional Cost. 32.7. Successful Bidder Should Measure Room Vibration And Any Magnetic Fields At The Installation Site / Room And Provide All Antivibration Table / Platform And Magnetic Shielding Units Or Any Other Essential Things Necessary For Smooth Running Of Instrument Free Of Cost. Signed 2 1 Letter Should Be Provided By The Bidder Regarding The Same During Tender Document Submission. Tender Will Be Rejected If Any Necessary Documents Are Not Submitted. 33 Availability Of Spares Parts The Vendor Will Have To Guarantee That All The Spare Parts For The Offered Fe-Sem And Attachments Will Be Available For At Least The Next 8-10 Years. 34 Additional Requirements Company Should Provide Expert Operator For 5 Years. It Should Be Quoted Additionally. 35 Note 35.1. Bidders Should Give Point By Point Compliance W.R.T. The Tender Specifications. Bidders Should Also Provide Technical Literature And Brochure Of The Offered Model. All The Important Technical Parameters Should Be Clearly Mentioned In The Oem Brochure / Data Sheet And Should Be Available In Public Domain ( E.G., Global Website ) . Bids Without Technical Literature Will Be Summarily Rejected. 35.2. During Technical Evaluation Of The Bid, User May Ask For Live Demo Of The Similar System To Demonstrate The Nit Specification. 35.3. All Optional Items Must Be Mentioned And Quoted Under Sub Column Clearly And Separately Otherwise The Bid Will Be Technically Rejected.

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