The Subject Of The Order Will Be The Delivery Of An Optical Profile, Which Will Be Intended For Testing In A Non -Unvacious Way 3D Surface: • A Device Enabling Testing Of Surface Topography Parameters Such As, Among Others. Height Differences, Roughness In Accordance With The Latest Iso Standards • Head On The Column With The Possibility Of Adapting Height To The Sample Dimensions, Enabling Scanning Of Samples With A Maximum Height Of Min. 150 Mm • The System Should Allow Sample Scanning With Two Techniques At The Same Time Confocal And Focal Differentiation In Order To Increase The Number Of Measured Points, Thus Not Increasing The Scan Time • Motion Range In The Axis With In A Motorized Manner Min. 40Mm, • A Device Equipped With Autofocus Function, Automatic Focusing On The Surface Of The Sample, • The Device In The Form Of A Single -Free Platform Or In Modules Should Ensure Work In Confocal, Interferometric And Focal Differentiation. 630Nm, And Min. One Source Of White Light, Necessary For Samples With Different Levels Of Transparency, Reflection And For Better Resolution • The Possibility Of Expanding With An Additional Led Ring Lighting With A Diffuser Controlled From The Software Level, • Device Enabling Thickness And Analysis Of The Topography Of Transparent Layers, • Device Working With High Accuracy And Repetition Offering Not Lower Than: 1 Nanometer For Interferometric Technique Regardless Of The Lens For Vsi (Verita Scanning Interferometers); 0.1 Nanomter For Pss (Phase Shifting Interferometers); 1 Nanometer For The Confocal Method (Using The Appropriate High -Numeric Lens On), • Objective Bowl Min. 5-Nest, • Measuring System Equipped With Min. 1 Lens Made Of Fluorite Glass With A High Working Distance Enabling Scanning Of Both Smaller And Larger Depressions On The Surface, With Parameters Not Worse Than: 20X Lens With Numerical Aperture Min. At 0.45 And Working Distance Min. 4.5Mm • The Possibility Of Expanding With Additional Lenses For A Bright Field And For Interferometry, • Scanning Range In Axis With No Less Than: 10Mm For The Vsi Interferometric Method And 36Mm For The Confocal Method, • A Device Equipped With A Motorized Table With A Range Of Min. 110X70mm • Device Equipped With Software: For Surface Topography Analysis In Accordance With Iso 25178 And Roughness Profile In Accordance With Iso 4287; Enabling The Creation Of 3D Maps Of The Surface With The Possibility Of Applying Profiles Enabling Measurement Of Height, Angles, Rounding Rays, Distances Between Individual Measured Elements. • The Possibility Of Expanding With Software Enabling Serial Measurements, Analysis And Presentation Of Results In The Form Of A Report For Many Samples In An Automatic And Repetitive Manner Based On Previously Prepared Measurement Procedures, After Automatically Recognizing The Starting Space By The System, Equipped With A Dedicated Computer With 27 + Joystick Lcd Monitor, • Device Equipped With A Dedicated Camera 1360X1024 Pixels With A Ccd M
Contact Information
Address
Politechnika Warszawska,Warszawa,00-661,Mazowieckie,Pl911 - Miasto Warszawa
Contact No.
+48222348757
Email
michal.haraburda@pw.edu.pl
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