Tenders Are Invited For Electron Microscopes – High-Resolution Scanning Electron Microscope With Analysis Of ... in Czech Republic
Tender Notice
TenderID
90659525
Tender Brief
Tenders Are Invited For Electron Microscopes – High-Resolution Scanning Electron Microscope With Analysis Of Elemental And Phase Composition And Crystallographic Orientation
Electron Microscopes – High-Resolution Scanning Electron Microscope With Analysis Of Elemental And Phase Composition And Crystallographic Orientation. The Subject Of The Public Order Is The Supply Of A Scanning Electron Microscope (Sem) With Eds And Ebsd Detectors For The Surface Analysis Of Solids With Micro- To Nanometer Resolution Enabling The Characterization Of Morphology And Microstructure, Elemental And Phase Composition And Crystallographic Orientation In Conductive And Non-Conductive Samples.
Contact Information
Address
Na Slovance 1999
Contact No.
+420 266052751
Email
kafkav@fzu.cz
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