Tenders Are Invited For Mass Spectrometer – Delivery Of A Dynamic Secondary Ion Mass Spectrometer. in Poland

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Mass Spectrometer – Delivery Of A Dynamic Secondary Ion Mass Spectrometer.. Please Scroll Down For The English Version The Subject Of The Order Is The Delivery And Commissioning Of A Secondary Ion Mass Spectrometer (Sims) Intended For The Characterization Of The Obtained Substrate Crystals And Implanted Gan Substrates In Terms Of The Content Of Intentionally Introduced Dopants And Unintentional Impurities. The Device Must Ensure Precise Elemental And Isotopic Analyzes In Nitride Semiconductors, Such As Doped And Implanted Crystals. The Device Must Enable Depth Profiling With High Resolution And Wide Dynamic Range, And Offer Excellent Detection Limits Thanks To Two High-Density Ion Sources (O2+ And Cs+). The Spectrometer Must Be Equipped With An Automatic Sample Loading System, Which Will Ensure Remote Operation And Analysis Of Multiple Samples In A Chain Mode, With Minimal Operator Intervention. A Detailed Description Of The Subject Of The Order Can Be Found In Point 3 Of Swz English Version The Subject Of The Order Is The Delivery And Commissioning Of A Secondary Ion Mass Spectrometer (Sims) Designed For The Characterization Of Obtained Substrate Crystals And Implanted Gan Substrates In Terms Of The Content Of Intentionally Introduced Dopants And Unintentional Impurities. The Device Must Ensure The Performance Of Precise Elemental And Isotopic Analyzes In Nitride Semiconductors, Such As Doped And Implanted Crystals. The Device Must Enable Depth Profiling With High Resolution And A Wide Dynamic Range, And Also Offer Excellent Detection Limits Thanks To Two High-Density Ion Sources (O2+ And Cs+). The Spectrometer Must Be Equipped With An Automatic Sample Loading System, Which Will Ensure Remote Operation And Analysis Of Many Samples In Chain Mode, With Minimal Operator Intervention. A Detailed Description Of The Subject Of The Order Can Be Found In Point 3 Of The Swz

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