Instruments For Checking Physical Characteristics – High-Resolution Scanning Electron Microscope For Material Research. Delivery - A Scanning Electron Microscope, Equipped With A Schottky Electron Source, Two Electron Detectors (1 × Se, 1 × Bse) Located In The Microscope Tube, Two Electron Detectors (1 × Se, 1 × Bse) Located In The Microscope Chamber And A Segmented Electron Detector ( Te). The Microscope Must Be Able To Work In The So-Called Immersion Mode, Include An Ir Camera For Looking Into The Chamber During Operation, A Multi-Purpose Sample Holder And A Camera For Easy Navigation On The Sample Holder Or Directly On The Sample.
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