Tenders Are Invited For Laboratory, Optical And Precision Equipments (Excl. Glasses) – Uhv Cluster For Pulse ... in Switzerland

Work Detail

Laboratory, Optical And Precision Equipments (Excl. Glasses) – Uhv Cluster For Pulsed Laser Deposition And Sputtering Of Epitaxial Quantum Materials (Pld-Sp-Cl). The Physics Institute Plans To Procure A Uhv Cluster For Pulsed Laser Deposition And Sputtering (Pld-Sp-Cl) Of Epitaxial Heterostructures With Monolayer Precision. The System Will Enable Material Synthesis On Oxide Substrates With An Area Of ​​Up To 10 X 10 Mm². The Pld And Sputtering Chambers Must Have Base Pressures < 10⁻⁷ Mbar And Be Accessible Via A Lock Chamber For Rapid Sample Exchange. The Pld And Sputtering Chambers Must Be Connected To Each Other For Sample Transfer In Vacuum. The Pld Must Have In-Situ Rheed For Growth Monitoring And Enable Substrate Temperatures Of At Least 950°C. The Sputtering System Enables Dc Magnetron Sputtering At A Substrate Temperature Of Up To 700°C. The System Must Be Compatible With The Use Of Flag-Style-Type Sample Carriers And Transfer To An Externally Provided Vacuum Case For Transport To Other Ex Situ Characterization Equipment. The Physics Institute Plans To Purchase A Uhv Cluster For Pulsed Laser Deposition And Sputtering (Pld-Sp-Cl) Of Epitaxial Heterostructures With Monolayer Precision. The System Will Enable Materials Synthesis On Oxide Substrates Up To 10 X 10 Mm² In Area. The Pld And Sputter Chambers Must Have Base Pressures < 10⁻⁷ Mbar, And Must Be Accessible Through A Loadlock Chamber For Rapid Sample Exchange. The Pld And Sputter Deposition Chambers Must Be Interconnected For In-Vacuum Sample Transfer. The Pld Must Have In-Situ Rheed For Growth Monitoring And Allow Substrate Temperatures Up To At Least 950°C. The Sputter Will Allow For Dc Magnetron Sputtering At Substrate Temperature Up To 700°C. The System Must Be Compatible With The Use Of Flag-Style-Type Sample Carrier Plates And Transfer To An Externally Provided Vacuum Suitcase For Transport To Other Ex-Situ Characterization Tools.

Contact Information