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    • Tenders Are Invited For Cryogenic Focused Ion Beam-Scanning Electron Microscope(1) in China

    Tender Notice
    TenderID 88594208
    Tender Brief Tenders Are Invited For Cryogenic Focused Ion Beam-Scanning Electron Microscope(1)
    Competition Type ICB/NCB (Plz Refer Document)
    Funded By Self-Funded
    Country China
    Tender Value Plz Refer Document
    Tender Value In USD Plz Refer Document

    Key Dates
    Publish Date 15 Nov 2024
    Last Date of Bid Submission 06 Dec 2024

    CPVs
    38500000-Checking and testing apparatus
    38000000-Laboratory, optical and precision equipments (excl. glasses)
    38510000-Microscopes
    44000000-Construction structures and materials; auxiliary products to construction (except electric apparatus)
    44100000-Construction materials and associated items
    44110000-Construction materials

    Other Detail
    View Original Tender Notice / Tender Document

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