Tenders Are Invited For Research, Testing And Scientific Technical Simulator – Systems For The Characterizat ... in Italy
Tender Notice
TenderID
85265691
Tender Brief
Tenders Are Invited For Research, Testing And Scientific Technical Simulator – Systems For The Characterization Of The Crystalloggraphic Quality And Defectiveness Of Semiconductors Divided Into Two Lots
Research, Testing And Scientific Technical Simulator – Systems For The Characterization Of The Crystalloggraphic Quality And Defectiveness Of Semiconductors Divided Into Two Lots. Lot 1 - Multifunctional High Angular Resolution X-Ray Diffractometer For Microelectronics Applications,Lot 2 - Spectrometer For The Electrical Characterization Of Deep Levels In Wide Band Band Semiconductors
Contact Information
Contact No.
0955968213
Email
gare@imm.cnr.it
View Notice Now...
Fill Detail for Getting Instant Access
Download Tender Document / Tender Notice
Dear Sir,
Warm Greetings from TenderDetail.com !!
We have received Tender Document request for the TDR No : 85265691
Tender Notice along with it's Attachments ( Tender Document / Scan Image of News Paper)
sent to your Email Address :.
Please check your email for Tender Document.
