Tenders Are Invited For Electron Microscopes – Nanofabrication System Combining Electron Microscopy And Ion ... in Czech Republic
Tender Notice
TenderID
83006687
Tender Brief
Tenders Are Invited For Electron Microscopes – Nanofabrication System Combining Electron Microscopy And Ion Beam Machining With The Possibility Of In-Situ Metal Deposition
Electron Microscopes – Nanofabrication System Combining Electron Microscopy And Ion Beam Machining With The Possibility Of In-Situ Metal Deposition. The Subject Of The Public Contract Is The Supply Of A Double-Beam Electron-Ion Microscope, Which, Among Other Things, Enables The Preparation Of Ultra-Thin (Below 50 Nm) Slides Compatible With Conventional Scanning Transmission Electron Microscopy According To Common Procedures.
Contact Information
Address
Na Slovance 1999
Contact No.
+420 266052751
Email
kafkav@fzu.cz
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