Scanning Probe Microscopes – Atomic Force Microscope For Analyzing The Surface Topology Of Target And Optical Materials. The Subject Of The Public Contract Is The Supply Of An Atomic Force Microscope For The Purpose Of Performing Surface Topology Analysis Of Target And Optical Materials (Polymers, Ionic Crystals, Glasses, Semiconductors, Metals).
Contact Information
Address
Na Slovance 1999
Contact No.
+420 266052751
Email
kafkav@fzu.cz
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