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Tenders Are Invited For Ion Microscopes – Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib) in France

Tender Notice

TenderID 79560800
Tender Brief Tenders Are Invited For Ion Microscopes – Electron Microscopy (Sem) System Coupled To A Focused Ion Beam (Fib)
Competition Type ICB/NCB (Plz Refer Document)
Funded By Self-Funded
Country France
Tender Value EUR 100,000,000
Tender Value In USD 107,080,000

Key Dates

Publish Date 22 Apr 2024
Last Date of Bid Submission 21 May 2024

CPVs

Other Detail

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