Prior Information Notice For Ion Microscopes – An Electron Microscope With A Xenon Focused Ion Beam in Czech Republic

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Prior Information Notice For Ion Microscopes – An Electron Microscope With A Xenon Focused Ion Beam. The Subject Of The Order Is A Double-Beam Electron Microscope With A Xenon Focused Ion Beam (Dual Beam) Sem/Pfib In An Assembly According To Technical Specifications. Analytical Equipment For The Eds, Ebsd And Sims Methods Is Part Of The Set In Demand. The Sem/Pfib Microscope With All Supporting Devices (Hereinafter Referred To As The System) Is Delivered In Such A Configuration That Guarantees The Full Functionality Of The Whole And All Its Parts, I.E. All Necessary Auxiliary Devices Are Part Of The Delivery And Their Mutual Cooperation Is Guaranteed. The System Also Includes Sufficient Safeguards To Protect The Microscope, Its Vacuum System And Electronics From Serious Damage In The Event Of A Sudden Interruption Of The Power Supply, Failure Of The Water Cooling (If Used) And Vacuum Pumping System. If The System Is Not Inherently Safe Against Destruction Of The Electron And Ion Source Upon Loss Of Vacuum, Then The Vacuum System Must Maintain A Safe Pressure Level In Critical Parts Of The Tube For At Least 30 Minutes. If A Backup Power Supply (Ups) With A Power Greater Than 4.8 Kw (See Paragraph 2) Is Needed To Ensure The Emergency Function, I.E. Ensuring The Safe State Of The Source Of Electrons And Ions, This Will Be Included In The Delivery. In That Case, The Backup Source Will Guarantee The Maintenance Of Safe Conditions For At Least 12 Hours. Due To The Limited Space In The Available Technical Room, It Is Also Required That The Ups, Including The Battery Modules, Can Be Installed In The Existing 19 Cabinet With A Depth Of 800 Mm. The Free Space In The Cabinet Has A Height Of 10 U (Rack Unit). Detailed Information Will Be Specified And Specified In The Tender Documentation.

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