Tender Notice |
|
| TenderID | 56758616 |
| Tender Brief | Tenders Are Invited For Suite Of Scanning Electron And Focused Ion Beam Microscopes |
| Competition Type | ICB/NCB (Plz Refer Document) |
| Funded By | Self-Funded |
| Country | United States |
| Tender Value | Plz Refer Document |
| Tender Value In USD | Plz Refer Document |
Key Dates |
|
| Publish Date | 25 Oct 2022 |
| Last Date of Bid Submission | 23 Nov 2022 |
CPVs |
|
| 38900000-Miscellaneous evaluation or testing instruments | |
| 38510000-Microscopes | |
Other Detail |
|
| View Original Tender Notice / Tender Document |
