Prior Information Notice For Miscellaneous Special-Purpose Machinery – Prior Information Notice – Rf On-Wafer Probe Station. The Ferdinand-Braun-Institut (Fbh) Plans To Procure An Automated Rf On-Wafer Probing System Within The Framework Of The Eu-Funded Apecs Programme. The System Will Be Used For Electrical Characterisation Of Semiconductor Devices, Circuits And Demonstrators At Wafer Level. It Is Intended To Enable High-Frequency And Mmwave Measurements Under Controlled And Reproducible Conditions. The Equipment Shall Support Automated Probing Of Wafers Up To 200 Mm In Diameter And Provide A Versatile Platform For A Wide Range Of Rf Measurements. It Will Be Installed In A Cleanroom Environment And Integrated Into Existing Measurement And Process Workflows. The Procurement Procedure Is Planned For 2026.
Contact Information
Address
Ferdinand-Braun-Institut gGmbH Leibniz-Institut für Höchstfrequenztechnik
Contact No.
03063928384
Email
vergabekammer@senweb.berlin.de
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