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Tenders Are Invited For Electron Backscatter Diffraction Detector For Focused Ion Beam Microscope (2) in China

Tender Notice

TenderID 113710978
Tender Brief Tenders Are Invited For Electron Backscatter Diffraction Detector For Focused Ion Beam Microscope (2)
Competition Type ICB/NCB (Plz Refer Document)
Funded By Self-Funded
Country China
Tender Value Plz Refer Document
Tender Value In USD Plz Refer Document

Key Dates

Publish Date 28 May 2026
Last Date of Bid Submission 18 Jun 2026

CPVs

38510000-Microscopes

Other Detail

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