Tenders Are Invited For Scanning Electron Microscopes – Supply Of A Nuclearized Double Electron And Ion Beam ... in France
Tender Notice
TenderID
112663315
Tender Brief
Tenders Are Invited For Scanning Electron Microscopes – Supply Of A Nuclearized Double Electron And Ion Beam Microscope (Meb-Fib) And Its Accessories (In-Situ Nano-Indenter And Metallization And Carbon Deposition System) For The Materials Physics Group.
Scanning Electron Microscopes – Supply Of A Nuclearized Double Electron And Ion Beam Microscope (Meb-Fib) And Its Accessories (In-Situ Nano-Indenter And Metallization And Carbon Deposition System) For The Materials Physics Group.. 00) Eastern European Time, Central European Summer Time,Machines And Apparatus For Testing And Measuring France,Seine-Maritime(Frd22)Saint Etienne Du Rouvray Duration2Years Deadline For Receipt Of Tenders08/06/2026-110000 (Utc+0200) Eastern European Time, Central European Summer Time,Laboratory, Optical And Precision Equipments (Excl. Glasses) France,Seine-Maritime(Frd22)Saint Etienne Du Rouvray Duration2Years Deadline For Receipt Of Tenders08/06/2026-110000 (Utc+0200) Eastern European Time, Central European Summer Time,Lot 1 Meb/Fib,Lot 2 Nano-Indenteur In Situ,Lot 3 Metallization And Carbon Deposition System
Contact Information
Address
1 rue Thomas Becket
Contact No.
0235147006
Email
marchepublic@univ-rouen.fr
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