Scanning Probe Microscopes – Raman- & Afm-System. The Fraunhofer Institute For Laser Technology Ilt Intends To Purchase Both A Confocal Raman Microscope For The Micro- And Nanoscale Measurement Of The Crystallographic Properties Of Various Materials Such As Glass, Sapphire Or Various Semiconductors, As Well As An Atomic Force Microscope (Afm) For The Nanoscale Measurement Of The Topography And The Electrical Properties Of Various Materials, Such As Glass, Sapphire Or Various Semiconductors. Only Offers That Contain Both Items From The Same Manufacturer Will Be Considered. For Further Details See The List Of Services. Eligibility Criteria: - Sales Of The Last Two Years (2024, 2025) - The Provider Must Provide Evidence Of References For Two Functional, Comparable Systems - Evidence Of The Possibility Of Easily Carrying Out Correlative Measurements Between The Afm And Raman Systems Award Criteria: - Fulfillment Of Specifications: 55% - Price: 35% - Sustainability (Power Consumption): 10% Evaluation Is Carried Out According To A Metric Evaluation Scale.
Contact Information
Address
Steinbachstrasse 15
Contact No.
+49 2418906144
Email
emre.akkas@ilt.fraunhofer.de
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