Bids Are Invited For Dynamic Secondary Ion Mass Spectroscopy Characterization System in Canada

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Dynamic Secondary Ion Mass Spectroscopy Characterization System . The Objective Of This Solicitation Is To Select A Supplier To Manufacture, Deliver, Install, And Commission A State-Of-The-Art Dynamic Secondary Ion Mass Spectrometry (Sims) System. The Proposed System Must Meet Rigorous Performance Standards Regarding Sensitivity, Depth Resolution, And Sample Throughput. It Must Be Capable Of Characterizing A Comprehensive Suite Of Semiconductor Materials, Including Group Iv, Iii/V, Iii/Nitride, And Ii-Vi Compounds, And A Wide Range Of Elements. Additionally, The Scope Includes Comprehensive Post-Installation Support, Including Operator Training And A Long-Term Maintenance Agreement To Ensure High Instrument Uptime. All The Deliverables Must Be Received On Or Before March 31, 2027.

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