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Tender For S And I Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope (Fib-Fesem) in India

Tender Notice
TenderID	107699805
Tender Brief	Tender For S And I Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope (Fib-Fesem)
Competition Type	ICB/NCB (Plz Refer Document)
Funded By	Self-Funded
Country	India
Tender Value	Plz Refer Document
Tender Value In USD	Plz Refer Document

Key Dates
Publish Date	19 Jan 2026
Last Date of Bid Submission	03 Feb 2026

CPVs
	38510000-Microscopes

Other Detail
View Original Tender Notice / Tender Document

Work Detail
S And I Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope (Fib-Fesem) , Main Item , Supply And Installation Of Dual Beam Focused Ion Beam - Field Emission Gun Scanning Electron Microscope (Fib-Fesem) (Detailed Specifications And Requirements As Per Annexure-A Of Tender Document) , Amc For 1St Year After Warranty , Amc For 2Nd Year After Warranty , Amc For 3Rd Year After Warranty

Contact Information
Contact Person	The Deputy Registrar
Address	R and D Section, IIT Ropar

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