Tenders Are Invited For Checking And Testing Apparatus – Delivery Of A System For Testing The Nano-Rheology ... in Poland
Tender Notice
TenderID
104903058
Tender Brief
Tenders Are Invited For Checking And Testing Apparatus – Delivery Of A System For Testing The Nano-Rheology Of Plant Biomaterials For The Institute Of Agrophysics. B. Dobrzański Pan In Lublin
Checking And Testing Apparatus – Delivery Of A System For Testing The Nano-Rheology Of Plant Biomaterials For The Institute Of Agrophysics. B. Dobrzański Pan In Lublin. The Scope Of The Order Includes The Delivery To The Ordering Party Of: A System For Testing The Nano-Rheology Of Plant Biomaterials. A Detailed Description Of The Subject Of The Order Is Included In Annex No. 1 To The Swz. List Of Minimum Required Technical And Performance Parameters: No. Minimum Required Parameter: 1.1. Afm 1.1 Head. Motorized Laser And Detector Alignment 1.2. Atomic Scale Resolution 1.3. For Samples With Sizes Min. Ø140 Mm X 18 Mm; 1.4. Equipped With Three Stepper Motors For Automatic Approach To The Sensor With A Movement Range > 19 Mm 1.5. The Head Is Completely Tight Against Steam And Liquids 1.6. Noise Level <2 Pm Rms 1.7. Deviation Detection Bandwidth Up To 8 Mhz 1.8. Probe Calibration With Thermal Noise Up To 3.25 Mhz Air And Liquid Imaging Modes Included: 1.9. • Tapping Mode With Linear Control Of The Force Interaction Between The Afm Lever And The Sample With The Afm Lever Oscillation Frequency Up To 10 Khz 1.10. • Quantitative Imaging 1.11. • A Mode Combining Tapping Mode With Linear Control Of The Force Interaction Between The Afm Lever And The Sample With Quantitative Imaging With Linear Movement 1.12. • Contact Mode With Lateral Force 1.13. • Tapping Mode With Phase Shift Imaging Of Afm Lever Oscillations 1.14. • Magnetic Force Microscopy Non-Imaging Modes: 1.15. • Force-Distance Spectroscopy, 1.16. • Force-Distance Curve Mapping Scanner Specifications: 1.17. • Closed-Loop Control 1.18. • Z Axis Mechanically Separated From The Xy Scanner 1.19. • 3-Axis Position Capacitive Sensor For Closed Feedback Loop Operation 1.20. • Z Noise (In Feedback) <30 Pm Rms 1.21. • Xy Scanning Range Minimum 100 Μm X 100 Μm (Sensor Noise Level <90 Pm Rms) 1.22. • Z Scan Range Minimum 15 Μm (Noise Level < 40 Pm Rms On 15 Μm Piezoelectric Element) 1.23. Ir Light Source With Low Coherence And Vertical Incidence 1.24. Head Enabling Integration With Inverted Optical Microscopes 1.25. Three Motors For Automatic Zoom And Tilt Correction Including Remote Access To Monitor Experiments Via Computer, Tablet Or Mobile Phone 1.26. Possibility Of Cleaning With Detergents, Solvents (Indicated By The Contractor) And Ultrasonic Bath 1.27. The Set Includes A Stand For The Afm 2 Head. 2.1 Controller. Digital Spm 2.2 Controller. Data Capture With A Maximum Data Pixel Rate Of Up To 800,000 Pixels/S 2.3. Modular Hybrid Analog-Digital Design With Fpga/Ppc Technology (Dual-Core Powerpc @ 1.4 Ghz) 2.4. Minimum 2 Minimum 16-Bit Adc Channels With A Sampling Rate Of Minimum 60 Mhz 2.5. Minimum 6 Minimum 18-Bit Adc Channels With A Sampling Rate Of Minimum 800 Kh 2.6. Minimum 1 Fast Minimum 14-Bit Dac Channel With A Minimum Sampling Rate Of 120 Mhz 2.7. Minimum 4 Minimum 20-Bit Dac Channels With A Sampling Rate Of Minimum 800 Khz 2.8. Amplitude Detection Amplifier I
Contact Information
Contact No.
81 744 50 61
Email
sekretariat@ipan.lublin.pl
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