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Tenders Are Invited For Atomic Force Microscope, Focused Ion Beam-Scanning Electron Microscope (Including Au ... in China

Tender Notice

TenderID 104735412
Tender Brief Tenders Are Invited For Atomic Force Microscope, Focused Ion Beam-Scanning Electron Microscope (Including Automatic Mineral Analysis System) Procurement Project
Competition Type ICB/NCB (Plz Refer Document)
Funded By Self-Funded
Country China
Tender Value Plz Refer Document
Tender Value In USD Plz Refer Document

Key Dates

Publish Date 14 Nov 2025
Last Date of Bid Submission 04 Dec 2025

CPVs

38510000-Microscopes

Other Detail

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